detector / silicon drift / real-time

X-Max Extreme Silicon Drift Detector is a breakthrough solution for ultra high resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.

The X-Max Extreme is a windowless 100mm2 version of X-Max designed to maximise sensitivity and spatial resolution. It uses a radical geometry to optimise both imaging and EDS performance in ultra-high resolution FEG-SEMs while working at low kV and short working distance. With X-Max Extreme, EDS resolution approaches that of the SEM.


Ultimate spatial resolution for SEM-EDS
Sub 10nm element characterisation in the FEG-SEM
Surface science sensitivity
Characterise surfaces in the SEM
Materials discrimination at the lowest kV
Down to 1kV materials characterisation
Fastest and most accurate nano-characterisation
Fast collection, real-time data processing from a bulk sample
Extreme light element sensitivity
New levels of detectability for elements such as lithium, nitrogen and oxygen