benchtop analyzer / XRF / X-ray fluorescence

Thick800 is designed mainly for non-destructive detection of elemental analysis and plating thickness. Its adopts best lightening structure and has a 3D movable sample platform with a laser positioning system. This enables the point-by-point detection of elemental content and plating thickness. The X-ray radiations can be prevented with the help of up-and-down movable glass shield. Its offers thickness measurement accuracy of 10nm. It is also possible to analyze 5 layers simultaneously. Correction models are affected by independent matrix. Its repeatability is up to 10nm. The open chamber 3D movement is realized by a 2D moveable platform. There is also a double laser positioning system.