optical coordinate measuring machine / non-contact / for small parts / high-precision

The world's first CMM that can provide surface roughness, shape, and size data — all with one measurement technique.

Bruker’s Contour CMM system is specifically designed to measure the small features found in the increasing number of applications that require both precise dimensional metrology and 3D surface analysis.

Contour CMM provides engineers and researchers the ability to perform simultaneous nanoscale height and surface texture, and 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument.