non-contact profilometer / optical

From the highly recognized and world class brand of Nikons innovation is proprietary scanning-type optical interference measurement technology achieves height resolution. Nikon provides a variety of optical microscopes as measurement systems to suit range of measurement applications. Packed with key benefits that includes superior quality measurement performance, detect 0.1 nm-level measurements of ultra-smooth surfaces with neither averaging nor filtering process. It also enables measurements with the same height resolution in various range of magnifications. Captures both an all-in-focus image and a surface height image. Composed of different modes of observation methods and the system can be used as optical microscope.