atomic force microscope / scanning probe / measurement / high-resolution
Dimension FastScan Pro
INO Group
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Type:
atomic force, scanning probe
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Technical applications:
measurement
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Other characteristics:
high-resolution, high-precision
• High-Resolution Imaging & Most Precise Measurements
• Unique, Quantitative Results, Whatever You Measure
• Easy to Use, Making Every User an AFM Expert
• Most Reliable Platform and Unrivalled Support
High-Resolution Imaging & Most Precise Measurements
PeakForce Tapping® enables consistent, high-resolution AFM imaging.
Unique technology enables pinpoint force to any atom on your sample.
The most precise probe-sample control permits widest range of sample types, from soft polymers, thin films and electrical samples to very hard materials.