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  1. Home
  2. Metrology - Laboratory
  3. Inspection and Monitoring
  4. FEM microscopes, X-ray microscopes, Electron microscopes

FEM microscopes, X-ray microscopes, Electron microscopes

Inspection and Monitoring
Conventional microscopes
FEM microscopes, X-ray microscopes, Electron microscopes
Endoscopes, Borescopes, Fiberscopes, Videoscopes
Robotic crawlers, UAVs ...
Line-scan cameras
Industrial CMOS area scan cameras
Other industrial video cameras
Infrared cameras and scanners
Industrial vision sensors
Industrial vision systems
Camera optics
Inspection machines for the electronics industry
Visual inspection machines, Video inspection machines
Machine condition monitoring
Data acquisition systems
Signal conditioners
Temperature data loggers, flow data loggers, pressure data loggers
Current data loggers, voltage data loggers, energy data loggers
Data loggers: Shock, vibration, fleet management
Environmental data loggers: temperature/humidity data loggers ...
Chart recorders, paperless recorders, videographic recorders
Data-loggers
  • compact microscope / variable pressure scanning / scanning electron

    compact microscope / variable pressure scanning / scanning electron

    FlexSEM 1000
    Hitachi High-Technologies Europe
    The FlexSEM 1000 VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides unrivaled ...
  • atomic force microscope / for analysis / high-resolution / transmission electron

    atomic force microscope / for analysis / high-resolution / transmission electron

    H-9500
    Hitachi High-Technologies Europe
    Spatial resolution: 0.18, 0.1 nm
  • analysis microscope / 3D / real-time / scanning electron with focused ion probe

    analysis microscope / 3D / real-time / scanning electron with focused ion probe

    NX9000
    Hitachi High-Technologies Europe
    Spatial resolution: 2.1, 1.6, 4 nm
  • analysis microscope / computerized / scanning electron with focused ion probe

    analysis microscope / computerized / scanning electron with focused ion probe

    NX2000
    Hitachi High-Technologies Europe
    Spatial resolution: 4, 60 nm
  • atomic force microscope / for analysis / topography

    atomic force microscope / for analysis / topography

    AFM5000II
    Hitachi High-Technologies Europe
    Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and ...
  • optical microscope / measurement / high-resolution / 3D

    optical microscope / measurement / high-resolution / 3D

    ContourGT-K
    Bruker Nano Surfaces
    Uncompromised Imaging and Metrology for Widest Range of Surfaces Combining exceptional profiling performance, operator convenience, and affordability into one bench top instrument The ContourGT-K 3D Optical Microscope sets a new industry ...
  • atomic force microscope / for analysis / high-resolution / for nanoindentation hardness

    atomic force microscope / for analysis / high-resolution / for nanoindentation hardness

    Dimension Icon®
    Bruker Nano Surfaces
    The Dimension Icon, manufactured by Bruker, is an atomic force microscope that has been created to look at objects on the atomic level. It provides picture of atoms on or in surfaces. It is also integrated with feedback alignment tools, ...
  • atomic force microscope / scanning probe / measurement / high-resolution

    atomic force microscope / scanning probe / measurement / high-resolution

    Dimension FastScan Pro
    Bruker Nano Surfaces
    • High-Resolution Imaging & Most Precise Measurements • Unique, Quantitative Results, Whatever You Measure • Easy to Use, Making Every User an AFM Expert • Most Reliable Platform and Unrivalled Support High-Resolution Imaging & ...
  • optical microscope / for analysis / bench-top / automated

    optical microscope / for analysis / bench-top / automated

    ContourGT-I
    Bruker Nano Surfaces
    World's First Automated Bench Top Profiler with Tip/Tilt Head Delivering uncompromised, gage-capable, measure-on-demand reliability to R&D and production environments. The ContourGT-I 3D Optical Microscope combines over three decades ...
  • optical microscope / for research / automated / 3D

    optical microscope / for research / automated / 3D

    ContourGT-X
    Bruker Nano Surfaces
    Automated, Gage-Capable Metrology for R&D and Production Providing world's only self-calibrating, fully automated solution for production line metrolgy. The fully automated, large-sample ContourGT-X 3D Optical Microscope combines ...
  • optical microscope / for analysis / for surface inspection / digital camera

    optical microscope / for analysis / for surface inspection / digital camera

    Eclipse Ci-POL
    Nikon Metrology
    Magnification: 5 unit - 100 unit
  • analysis microscope / scanning electron

    analysis microscope / scanning electron

    JCM-6000Plus
    Nikon Metrology
    Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope ...
  • optical microscope / measurement / digital camera / compact

    optical microscope / measurement / digital camera / compact

    MM-200
    Nikon Metrology
    Magnification: 1 unit - 10 unit
  • optical microscope / measurement / digital camera

    optical microscope / measurement / digital camera

    MM-400/800
    Nikon Metrology
    Magnification: 1 unit - 100 unit
  • optical microscope / for analysis / compact / bench-top

    optical microscope / for analysis / compact / bench-top

    MM-200
    Nikon Metrology
    Magnification: 1 unit - 10 unit
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