Analysis Microscope / Scanning Electron

analysis microscope / scanning electron

JCM-6000Plus

analysis microscope / scanning electron

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Technical applications:

for analysis
Other characteristics:

scanning electron

Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL

The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.

Go to the Nikon Metrology website for more information

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