laser micrometer / optical / thickness / non-contact
RF651 (25, 50, 75, 100 mm, +/-3…20 µm)
INO Group
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Type:
laser, optical
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Measurement:
thickness
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Other characterisitcs:
non-contact, CCD
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Applications:
for wire diameter
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Measuring range:
100 mm, 75 mm, 50 mm, 25 mm
The RF65X series is a kind of optical micrometers used for non-contact measurement and in controlling the position and dimensions of technological objects. The series measures diameters of wires, rods and other cylinders.
The operation of the series is based on the shadow principle. The series consist of two blocks transmitter and a receiver. The semiconductor laser is collimated by a lens. A shadow image is formed when an object is placed in the collimated beam region. It is scanned using a CMOS photo-detector array. In calculating the position size of the object from the shadow border, it uses a processor.
RF651 Series are direct through beam micrometers.