Ellipsometers

UVISEL 2 is a fully automated and integrated spectroscopic ellipsometer enabling accurate thin film thickness and optical constants characterization over the wavelength range 190 - 2100 nm. Sample alignment, autofocus, spot size selection, ...

Built on 25 years of experience, the UVISEL phase modulated ellipsometer delivers high precision and high resolution measurements with the best signal to noise ratio ideal for research on nano and micro scale structures. It is the most ...

The PHE101 is a wavelength ellipsometer. The device has a high accuracy and repetition due to its new features. The device operates through a fast rotating analyzer. It has a powerful software consisting of materials library. The device ...

The PHE101M is a multi-wavelegnth ellipsometer from Angstrom Advanced that is ideal for measuring the refractive index and thickness of single and multi-layer films at several wavelengths. It has a wide variable angle at 10-90° which ...

The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250-1,100 nm, 250-1,700 nm or 250-2,100 nm. In the PHE-102 ellipsometer, a broad band white light source is used to illuminate the sample ...

The PhE101S is very easy to use and can be fitted with the new laser alignment tool, which greatly improves the ease of use and speed of operation when compared to conventional ellipsometers. It has 3 measurement modes that are based ...

The S3000A™ System is a production worthy, high-performance transparent metrology tool for 300mm fab-wide applications. It incorporates Rudolph’s Focused Beam ellipsometry technology which was developed for demanding diffusion applications. ...

The SPR Series manufactured by Accurion, is a cell used for an ellipsometry that has a microfluidic cell and flexible design. This device is equipped with a manual microfluidic liquid handling unit that enables it for an easy usage. Moreover, ...